Analysis - Mounts


In geological SIMS (Secondary Ion Mass Spectrometry), the samples are typically polished mounts (thin sections, epoxy grains mounts) which are characterized by various forms of optical imaging (transmitted light, reflected light) and electron imaging (back scattered electrons, secondary electrons, cathodoluminescence). The standard mount for SHRIMP analysis is a 25 mm round disk that is held in a mount holder. This is placed in the sample lock and transferred to the sample rack in the source chamber.




Updated:  24 October 2011/ Responsible Officer:  SHRIMP Group leader/ Page Contact:  WebAdmin