The SHRIMP I design consists of a primary column containing the
ion source and focusing elements, the source chamber housing the
sample, the last of the primary ion optic elements, and the secondary
ion extraction optics. The mass analyser consists of a magnetic
sector preceded by an electrostatic analyser that compensates
for the energy dispersion of the magnet. A quadrupole lens is
inserted between the magnet and ESA to minimize second order aberrations.
The SHRIMP I design was presented to the first SIMS meeting in
Germany but the proceedings volume was never published. The PDF
file can be obtained here (Clement.pdf).